J. Trey Diulus National Institute of Standards and Technology Physical Measurement Laboratory/Nanoscale Device Characterization Division
Philip Doble, Lecturer University of Technology, Sydney Department of Chemistry, Materials and Forensic Science
John J. Dorning, Professor University of Virginia Department of Materials Science and Engineering
A Dowd, Lecturer University of Technology, Sydney Department of Physics and Advanced Materials
John C. Drach, Professor University of Michigan, Ann Arbor Department of Biologic & Materials Sciences
Vinayak P. Dravid, Professor University of Western Ontario Department of Materials Science & Engineering
MICHAEL J. DREWS, Professor Clemson University School of Materials Science and Engineering
Tobin A Driscoll, Professor University of Delaware Department of Materials Science and Engineering
Jincheng Du, Assistant Professor University of North Texas Department of Materials Science and Engineering
Renee Duff, Adjunct Lecturer University of Michigan, Ann Arbor Department of Biologic & Materials Sciences
Walter Duley, Adjunct Professor University of Waterloo Department of Physics & Astronomy
David C. Dunand, Professor University of Western Ontario Department of Materials Science & Engineering
Paul D. Dunbar, Assistant Professor University of Kentucky Department of Materials Engineering
Bruce S. Dunn, Professor University of California, Los Angeles Department of Materials Science and Engineering
John N. DuPont, Assistant Professor Lehigh University Department of Materials Science and Engineering

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